Rian SEGHIR
Chargé de recherche CNRS
Centrale Nantes
Bureau F232
Visible and InfraRed Fullfield Measurements,
Inverse methods and Data-Driven Stress identification,
Crystal plasticity, Fracture mechanics
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Visible and InfraRed Fullfield Measurements,
Inverse methods and Data-Driven Stress identification,
Crystal plasticity, Fracture mechanics
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|
|
|
|